实验室简介
一家从事半导体分立器件研发、生产和销售的高新技术企业

Tests and experiments carried out

NO.
Test/Experiment Name
According to the standard
Classification
1
Static parameter test
/
Routine static parameter test
2
tq
GB/T 15291-2015 9.1.10
3
ITSM
GB/T 15291-2015 9.3.3
4
dI/dt
GB/T 15291-2015 9.3.5
5

dV/dt
GB/T 15291-2015 9.1.11
6
Thyristor gate trigger characteristic test
GB/T 15291-2015 9.1.7
7
EFT
JESD51-3,JESD51-4
8
SAT
/
Reliability test
9
HTRB
GB/T 15291-2015,GB/T 4023-1997,JESD22-A108D,MIL-STD-750F
10
HTGB
GB/T 15291-2015,GB/T 4023-1997,JESD22-A108D,MIL-STD-750F
11
ACBV
GB/T 15291-2015,GB/T 4023-1997,JESD22-A108D,MIL-STD-750F
12
PC
JESD22-A113H
13
TC
JESD22-A104E
14
PCT
JESD22-A102E
15
UHAST
JESD22-A118B
16
HTSL
JESD22-A103E
17
LTSL
JESD22-A119A
18
THT
GB/T2423.3-2006,
JESD22-A101D
19
H3TRB
GB/T2423.3-2006,
JESD22-A101D
20
Damp heat,cyclic
GB/T2423.4-2008
21
Reflow
J-STD-020E,J-STD-033
22
RSH
JESD22-A111 (SMD),
JESD22-B106 (PTH)
23
SD
/