Routine static parameter test
Equipment Name |
Equipment Diagram |
Can Undertake Test Items |
According To The Standard |
JUNO test system |
 |
General static parameters of semiconductor devices |
/ |
DBC-091 Thyristor Turn-off Time Tester |
|
Single and triac turn-off time tq test |
GB/T 15291-2015 9.1.10 |
DBC-105 surge and peak voltage test bench |
|
Surge ITSM test of single and triac |
GB/T 15291-2015 9.3.3 |
DBC-082 on-state current critical rate of rise test bench |
|
DI/dt test of single and triac |
GB/T 15291-2015 9.3.5 |
DATA-206 thyristor dv/dt tester |
|
Single and triac dV/dt test |
GB/T 15291-2015 9.1.11 |
Thyristor gate trigger characteristic tester |
 |
IGT and VGT test of single and triac |
GB/T 15291-2015 9.1.7 |
QT2 Transistor Semiconductor Tube Characteristic Grapher |
 |
Static electrical parameters |
/ |
EFT electrical fast pulse group test |
 |
EFT electrical fast pulse group test |
JESD51-3，JESD51-4 |
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