实验室简介
一家从事半导体分立器件研发、生产和销售的高新技术企业

Reliability Test

Equipment Name
Equipment Diagram
Can Undertake Test Items
According To The Standard
Ultrasonic Scanning Microscope
weida
Layered ultrasound scan SAT
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Electric heating blast drying oven
weida
HTST
GB/T 2423.2
JESD22-A103
High and low temperature environmental test chamber
weida
HTST、 LTSL
JESD22-A103E JESD22-A119A
THT steady-state damp heat test chamber
weida
THT
GB/T2423.3-2006,
JESD22-A101D
PCT high pressure cooking experiment box
weida
PCT
JESD22-A102
uHAST High Accelerated Aging Test Chamber Without Bias
weida
THT、uHAST
JESD22-A110
JESD22-A118 GB/T2423.3
JESD22-A101
TC high and low temperature impact test chamber
weida
TC、HTST、 LTSL
JESD22-A104
GB/T 2423.22
HTRB high temperature reverse bias test chamber
weida
BURN-IN、HTRB、HTST、HTGB
GB/T 4587
JESD22-A108
H3TRB high temperature and high humidity reverse bias test chamber
weida
BURN-IN、HTRB、H3TRB、THT 、HTST、HTGB
GB/T2423.3-2006
JESD22-A101D
Reflow soldering
weida
Reflow
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