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Tests and experiments carried out
NO. |
Test Names / Test Items |
Based on Standard |
Category |
1 |
Static Parameter Test |
/ |
General Static Param. Test |
2 |
SCR Turn-off Time tq |
GB/T 15291-2015 9.1.10 |
|
3 |
Non-repetitive Peak On-state Current ITSM |
GB/T 15291-2015 9.3.3 |
|
4 |
ritical Rate of Rise of On-state Current dI/dt |
GB/T 15291-2015 9.3.5 |
|
5 |
Critical Rate of Rise of Off-state Voltage dV/dt |
GB/T 15291-2015 9.1.11 |
|
6 |
Thyristor Gate Trigger Characteristic Test |
GB/T 15291-2015 9.1.7 |
|
7 |
EFT Electrical Fast Transient Burst Test |
JESD51-3,JESD51-4 |
|
8 |
Ultrasonic Layered Scanning SAT |
/ |
Reliability Experiment |
9 |
High Temperature Reverse Bias HTRB |
GB/T 15291-2015,GB/T 4023-1997,JESD22-A108D,MIL-STD-750F |
|
10 |
High Temperature Gate Bias HTGB |
GB/T 15291-2015,GB/T 4023-1997,JESD22-A108D,MIL-STD-750F |
|
11 |
High Gate AC Blocking ACBV |
GB/T 15291-2015,GB/T 4023-1997,JESD22-A108D,MIL-STD-750F |
|
12 |
Preconditioning Test PC |
JESD22-A113H |
|
13 |
Temperature Cycling TC |
JESD22-A104E |
|
14 |
High Pressure Cookingnbsp;PCT |
JESD22-A102E |
|
15 |
Unbiased Highly Accelerated Humidity Test UHAST |
JESD22-A118B |
|
16 |
High Temperature Storage Life HTSL |
JESD22-A103E |
|
17 |
Low Temperature Storage Life LTSL |
JESD22-A119A |
|
18 |
High Temperature & High Humidity Storage THT |
GB/T2423.3-2006, JESD22-A101D |
|
19 |
High Temperature High Humidity Reverse Bias H3TRB |
GB/T2423.3-2006, JESD22-A101D |
|
20 |
Cyclic Humidity & Temperature Damp heat,cyclic |
GB/T2423.4-2008 |
|
21 |
Reflow Soldering Reflow |
J-STD-020E,J-STD-033 |
|
22 |
Soldering Heat Resistance RSH |
JESD22-A111 (SMD), JESD22-B106 (PTH) |
|
23 |
Solderability SD |
/ |
|
24 |
Salt Spray Test |
GB/T 2423.17 |
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Telephone:0514-87178001
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Website:www.wdsemi.com
Copyright Information: Jiangsu Weida Semiconductor Co., Ltd
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