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Routine static parameter testing
Device Name |
Equipment Diagram |
Capable of undertaking experimental projects |
According to the standard |
JUNO Test System |
 |
General Static Parameters of Semiconductor Devices |
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DBC-091 Thyristor Turn-off Time Tester |
|
tq Turn-off Time Test for Unidirectional and Bidirectional Thyristors |
GB/T 15291-2015 9.1.10 |
DBC-105 Surge & Peak Voltage Test Bench |
|
ITSM Test for Unidirectional and Bidirectional Thyristors |
GB/T 15291-2015 9.3.3 |
DBC-082 Thyristor Critical di/dt Test Bench |
|
dI/dt Test for Unidirectional and Bidirectional Thyristors |
GB/T 15291-2015 9.3.5 |
DATA-206 Thyristor dv/dt Tester |
|
dV/dt Test for Unidirectional and Bidirectional Thyristors |
GB/T 15291-2015 9.1.11 |
Thyristor Gate Trigger Characteristic Tester |
 |
IGT & VGT Test for Unidirectional and Bidirectional Thyristors |
GB/T 15291-2015 9.1.7 |
QT2 Transistor & Semiconductor Device Curve Tracer |
 |
Static Electrical Parameters |
/ |
Electrical Fast Transient Burst Test |
 |
EFT Electrical Fast Transient |
JESD51-3，JESD51-4 |
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Telephone:0514-87178001
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